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X-Parameters: Characterization, Modeling, and Design of Nonlinear RF and Microwave Components (The Cambridge RF and Microwave Engineering S
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- Sales Rank: #1387495 in Books
- Published on: 2013-11-11
- Original language: English
- Number of items: 1
- Dimensions: 9.72" h x .59" w x 6.85" l, 1.40 pounds
- Binding: Hardcover
- 233 pages
Review
"This book is an excellent treatise by experts from Agilent on the assumption and use of x-parameters."
Alfy Riddle, IEEE Microwave Magazine
About the Author
David E. Root is an Agilent Research Fellow at Agilent Technologies. He co-led the Agilent research and technical development of X-parameters through its commercialization. He is a Fellow of the IEEE and co-editor of Nonlinear Transistor Model Parameter Extraction Techniques (2011).
Jan Verspecht is a Master Research Engineer at Agilent Technologies. He invented X-parameters in 1996 and is a Fellow of the IEEE.
Jason Horn is an Expert Design Engineer at Agilent Technologies and has been heavily involved in the development of X-parameter measurements.
Mihai Marcu is a Senior Consultant at Agilent Technologies, deeply involved in the development and application of X-parameters for non-linear modeling.
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